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  Structures of incommensurate and commensurate composite crystals NaxCuO2 (x = 1.58, 1.6, 1.62)

van Smaalen, S., Dinnebier, R. E., Sofin, M., & Jansen, M. (2007). Structures of incommensurate and commensurate composite crystals NaxCuO2 (x = 1.58, 1.6, 1.62). Acta Crystallographica B, 63, 17-25.

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van Smaalen, S., Author
Dinnebier, R. E.1, Author           
Sofin, M.2, Author           
Jansen, M.2, Author           
Affiliations:
1Scientific Facility X-Ray Diffraction (Robert E. Dinnebier), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370494              
2Abteilung Jansen, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370503              

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 Abstract: NaxCuO2 (x similar or equal to 1.6) has been synthesized for different compositions x, resulting in both commensurate and incommensurate composite crystals. The crystal structures are reported for two incommensurate compounds (x = 1.58 and 1.62) determined by Rietveld refinements against X-ray powder diffraction data. The incommensurate compounds and commensurate Na8Cu5O10 (X = 1.6) are found to possess similar structures, with valence fluctuations of Cu2+/Cu3+ as the origin of the modulations of the CuO2 subsystems; the displacive modulations of Na being defined by the closest Na - O contacts between the subsystems. A comparison of the structure models obtained from single-crystal X-ray diffraction, synchrotron-radiation X-ray powder diffraction and Xray powder diffraction with Cu K alpha(1) radiation indicates that single-crystal X-ray diffraction is by far the most accurate method, while powder diffraction with radiation from an Xray tube provides the least accurate structure model.

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Language(s): eng - English
 Dates: 2007
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 338516
ISI: 000244521100003
 Degree: -

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Title: Acta Crystallographica B
Source Genre: Journal
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Pages: - Volume / Issue: 63 Sequence Number: - Start / End Page: 17 - 25 Identifier: ISSN: 0108-7681