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  Effects of compressive stress on the critical current of Bi-2223 tapes

Li, C. S., Mossang, E., Bellin, B., Antonevici, A., & Zhang, P. X. (2007). Effects of compressive stress on the critical current of Bi-2223 tapes. Physica C, 463, 882-884.

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 Creators:
Li, C. S., Author
Mossang, E.1, Author           
Bellin, B., Author
Antonevici, A., Author
Zhang, P. X.2, 3, Author           
Affiliations:
1High Magnetic Field Laboratory, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3371774              
2Scientific Facility Crystal Growth (Masahiko Isobe), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370496              
3Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370497              

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Free keywords: Bi-2223 tapes; transverse compressive stress; side compressive stress
 Abstract: We measured the critical current of Bi-2223 tapes as a function of transverse compressive stress perpendicular to the tape surface and side compressive stress parallel to the tape surface at 77 K. The effects of the cross-section size on the stress characteristics of AgMn-alloy sheathed Bi-2223 tapes were compared. The onset compressive stress for degradation of I, was lower in the thinner tape with a thin Ag sheath due to the stress concentration on the irregular interface. The irreversible transverse compressive stress and side compressive stress of the tapes with AgMn-alloy sheath were usually higher than 100 M Pa, which essentially meet the requirements of technical application. (C) 2007 Elsevier B.V. All rights reserved.

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Language(s): eng - English
 Dates: 2007
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 357098
ISI: 000250396000201
 Degree: -

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Title: Physica C
Source Genre: Journal
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Pages: - Volume / Issue: 463 Sequence Number: - Start / End Page: 882 - 884 Identifier: ISSN: 0921-4534