English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
 Local TagsRelease HistoryDetailsSummary
  Voltage x-ray reflectometry: A method to study electric-field-induced changes to interfacial electronic structures

Ilse, S. E., Schütz, G., & Goering, E. (2023). Voltage x-ray reflectometry: A method to study electric-field-induced changes to interfacial electronic structures. Physical Review Letters, 131(3): 036201. doi:10.1103/PhysRevLett.131.036201.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/21.11116/0000-000E-0689-1 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-068A-0
Genre: Journal Article

Files

show Files

Locators

show
hide
Locator:
https://doi.org/10.1103/PhysRevLett.131.036201 (Publisher version)
Description:
-
OA-Status:
Hybrid

Creators

show
hide
 Creators:
Ilse, S. E.1, 2, Author           
Schütz, Gisela1, Author           
Goering, E.1, 2, Author           
Affiliations:
1Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648              
2Max-Planck-Institute for Solid State Research, D-70569 Stuttgart, Germany, ou_persistent22              

Content

show
hide
Free keywords: Abt. Schütz
 Abstract: -

Details

show
hide
Language(s): eng - English
 Dates: 2023-07-182023-07-21
 Publication Status: Issued
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1103/PhysRevLett.131.036201
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Physical Review Letters
  Abbreviation : Phys. Rev. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Woodbury, N.Y. : American Physical Society
Pages: - Volume / Issue: 131 (3) Sequence Number: 036201 Start / End Page: - Identifier: ISSN: 0031-9007
CoNE: https://pure.mpg.de/cone/journals/resource/954925433406_1