Design criteria for scanning tunneling microscopes to reduce the response to 
external mechanical disturbances

Ast, C. R.; Assig, M.; Ast, A.; Kern, K.

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Design criteria for scanning tunneling microscopes to reduce the response to external mechanical disturbances

Ast, C. R., Assig, M., Ast, A., & Kern, K. (2008). Design criteria for scanning tunneling microscopes to reduce the response to external mechanical disturbances. Review of Scientific Instruments, 79(9): 093704.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-AE09-5 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-AE0A-4

Genre: Journal Article

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Creators:
Ast, C. R.¹, Author
Assig, M., Author
Ast, A., Author
Kern, K.¹, Author

Affiliations:
1Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370481

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Language(s): eng - English

Dates: Date issued: 2008

Publication Status: Issued

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Identifiers: eDoc: 409539
ISI: 000260291800026

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Title: Review of Scientific Instruments

Source Genre: Journal

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Pages: - Volume / Issue: 79 (9) Sequence Number: 093704 Start / End Page: - Identifier: ISSN: 0034-6748