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  Correlation of structural and magnetic properties of ferromagnetic Mn-implanted Si1-xGex films

Ko, V., Teo, K. L., Liew, T., Chong, T. C., Liu, T., Wee, A. T. S., et al. (2008). Correlation of structural and magnetic properties of ferromagnetic Mn-implanted Si1-xGex films. Journal of Applied Physics, 103(5): 053912.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-ACF2-F Version Permalink: https://hdl.handle.net/21.11116/0000-000E-ACF3-E
Genre: Journal Article

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 Creators:
Ko, V., Author
Teo, K. L., Author
Liew, T., Author
Chong, T. C., Author
Liu, T., Author
Wee, A. T. S., Author
Du, A. Y., Author
Stoffel, M.1, Author           
Schmidt, O. G.1, 2, 3, 4, Author           
Affiliations:
1Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370481              
2Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370501              
3Scientific Facility Nanostructuring Lab (Jürgen Weis), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370499              
4Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370504              

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Language(s): eng - English
 Dates: 2008
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 361657
ISI: 000254025000062
 Degree: -

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Title: Journal of Applied Physics
Source Genre: Journal
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 103 (5) Sequence Number: 053912 Start / End Page: - Identifier: ISSN: 0021-8979