In situ TEM unveils dynamic doping behavior of thermoelectric materials – 
Microstructure and property evolution under heating and electric biasing

Zhang, Siyuan; Yu, Y.; Jung, Chanwon; Abdellaoui, Lamya; Scheu, Christina

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In situ TEM unveils dynamic doping behavior of thermoelectric materials – Microstructure and property evolution under heating and electric biasing

Zhang, S., Yu, Y., Jung, C., Abdellaoui, L., & Scheu, C. (2023). In situ TEM unveils dynamic doping behavior of thermoelectric materials – Microstructure and property evolution under heating and electric biasing. Talk presented at International Microscopy Conference IMC20. Busan, Korea. 2023-09-10 - 2023-09-15.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-0CE4-4 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-0CE5-3

Genre: Talk

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Creators:
Zhang, Siyuan¹, Author
Yu, Y., Author
Jung, Chanwon¹, Author
Abdellaoui, Lamya¹, Author
Scheu, Christina¹, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294

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Language(s): eng - English

Dates: Created: 2023-09-12

Publication Status: Not specified

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Title: International Microscopy Conference IMC20

Place of Event: Busan, Korea

Start-/End Date: 2023-09-10 - 2023-09-15

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