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  Epitaxial HoN thin films: An investigation of the structural, electronic, and magnetic properties

Pereira, V. M., Meléndez-Sans, A., Chang, C.-F., Kuo, C.-Y., Chen, C. T., Tjeng, L. H., et al. (2023). Epitaxial HoN thin films: An investigation of the structural, electronic, and magnetic properties. Physical Review Materials, 7(12): 124405, pp. 1-12. doi:10.1103/PhysRevMaterials.7.124405.

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 Creators:
Pereira, V. M.1, Author           
Meléndez-Sans, A.1, Author           
Chang, C.-F.2, Author           
Kuo, C.-Y.1, Author           
Chen, C. T.3, Author
Tjeng, L. H.4, Author           
Altendorf, S. G.5, Author           
Affiliations:
1Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863445              
2Chun-Fu Chang, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863447              
3External Organizations, ou_persistent22              
4Liu Hao Tjeng, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863452              
5Simone Altendorf, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863458              

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Free keywords: Aluminum compounds, Magnesia, Magnetic properties, Magnetometry, Molecular beam epitaxy, Nanocrystals, Nitrogen, Substrates, Electronic and magnetic properties, Growth conditions, Growth window, Moderate pressures, Moderate temperature, Molecular nitrogen, Molecular-beam epitaxy, Nitrogen content, Temperature and pressures, Thin-films, Thin films
 Abstract: We report our study on the growth of HoN thin films on MgO (100) and LaAlO3 (100) substrates. By using molecular beam epitaxy, we thermally evaporate holmium in an atmosphere of molecular nitrogen, forming HoN at slow rates, moderate temperatures and pressures. We are able to carefully and systematically vary the growth conditions, thereby tuning the nitrogen content of our samples. We explore the differences in the growth window by looking at the crystalline structure and composition of the films deposited on the different substrates. We find that HoN has an epitaxial, well-ordered growth on LaAlO3, in contrast to the three-dimensional growth that occurs on MgO. Using a combination of in situ electron diffraction and x-ray spectroscopies, as well as ex situ x-ray diffraction and SQUID magnetometry, we investigate the structural, electronic, and magnetic properties of the epitaxial HoN films. © 2023 authors. Published by the American Physical Society.

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Language(s): eng - English
 Dates: 2023-11-132023-11-13
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1103/PhysRevMaterials.7.124405
 Degree: -

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Title: Physical Review Materials
  Abbreviation : Phys. Rev. Mater.
Source Genre: Journal
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Publ. Info: College Park, MD : American Physical Society
Pages: - Volume / Issue: 7 (12) Sequence Number: 124405 Start / End Page: 1 - 12 Identifier: ISSN: 2475-9953
CoNE: https://pure.mpg.de/cone/journals/resource/2475-9953