Fast Frequency-Domain Analysis for Parametric Electromagnetic Models Using Deep 
Learning

Mattucci, Elia; Feng, Lihong; Benner, Peter; Romano, Daniele; Antonini, Giulio

doi:10.1109/EPEPS58208.2023.10314879

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Fast Frequency-Domain Analysis for Parametric Electromagnetic Models Using Deep Learning

Mattucci, E., Feng, L., Benner, P., Romano, D., & Antonini, G. (2023). Fast Frequency-Domain Analysis for Parametric Electromagnetic Models Using Deep Learning. In 2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS). doi:10.1109/EPEPS58208.2023.10314879.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-2102-A Version Permalink: https://hdl.handle.net/21.11116/0000-000E-2103-9

Genre: Conference Paper

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Creators:
Mattucci, Elia¹, Author
Feng, Lihong², Author
Benner, Peter², Author
Romano, Daniele³, Author
Antonini, Giulio³, Author

Affiliations:
1Rete Ferroviaria Italiana S.p.A. Direzione Tecnica - Standard Tecnologie Rome, Italy, ou_persistent22
2Computational Methods in Systems and Control Theory, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society, ou_1738141
3Dipartimento di Ingegneria Industriale e dell’Informazione e di Economia University of L’Aquila L’Aquila, Italy, ou_persistent22

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Dates: Published Online: 2023

Publication Status: Published online

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Identifiers: DOI: 10.1109/EPEPS58208.2023.10314879

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Title: IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

Place of Event: Milpitas, CA, USA

Start-/End Date: 2023-10-15 - 2023-10-18

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Title: 2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

Source Genre: Proceedings

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Pages: 3 Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: -