English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Attosecond soft X-ray spectroscopy reveals energy flow in a semimetal

Sidiropoulos, T., Di Palo, N., Rivas, D., Severino, S., Reduzzi, M., Sun, H.-W., et al. (2023). Attosecond soft X-ray spectroscopy reveals energy flow in a semimetal. In 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC 2023). IEEE.

Item is

Basic

show hide
Genre: Conference Paper

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Sidiropoulos, T.P.H., Author
Di Palo, N., Author
Rivas, D.E., Author
Severino, S., Author
Reduzzi, M., Author
Sun, H.-W., Author
Chien, Y.-H., Author
Nandy, B., Author
Bauerhenne, B., Author
Krylow, S., Author
Vasileiadis, Thomas1, Author           
Danz, T., Author
Elliott, P., Author
Sharma, S., Author
Dewhurst, K., Author
Ropers, C., Author
Joly, Y., Author
Garcia, M.E., Author
Wolf, Martin1, Author                 
Ernstorfer, Ralph1, Author                 
Biegert, J., Author more..
Affiliations:
1Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              

Content

show
hide
Free keywords: -
 Abstract: We show that core-level x-ray absorption near edge structure (XANES) spectroscopy with attosecond soft x-ray (SXR) pulses [1] can image the flow of energy inside a material in real time [2]. We photoexcite graphite with a 11 ± 1 fs pump pulse at 1850 nm, or with a 15 ± 1 fs pulse at 800 nm, for various pump fluences between 2.8 ± 0.2 mJ/cm2 and 81 ± 5 mJ/cm2. Figure 1(a) shows the measured differential x-ray absorption ΔA(E) (pumped minus unpumped) from which striking changes of up to 15% are immediately apparent. We identify these features as π bonding state and as π* and σ* antibonding states. Attosecond-resolved measurement with a pump-probe delay step size of 0.6 fs show the buildup of coherent charge oscillations, i.e., polarization of the material. These oscillations occur at occupied states below and unoccupied states above the Fermi level predominantly at the pump carrier frequency. We identify the incoherent background due to the dephasing of coherent charge oscillation. This background rises within a few oscillations of the light field, signifying the ultrafast transfer of energy from the light field into the electron and hole excitation of the material. We find that ultrafast dephasing of the coherent carrier dynamics is governed by impact excitation (IE) for electrons, while holes exhibit a switchover from impact excitation to Auger heating (AH) already during the 11-fs duration of the infrared light field. We further analyze the coherent phonon signal by analyzing the oscillatory pattern exhibited by the σ* data with a short-time Fourier transform (STFT) analysis This analysis shows that already during and shortly after the laser excitation, coherent motion emerges over a broad range of frequencies. A comparison with the phonon dispersion from two-temperature-model molecular dynamics (TTM MD) simulations [4] [Fig. 1(e)] identifies them as the Raman-active Γ - E2g and the non-Raman-active K - A'1 SCOPs at 46.4 ± 2.7 and 42.7 ± 1.1 THz, respectively. The surprising early contribution from the (non-Raman-active) A'1 mode originate from the very strong electron-SCOPs coupling, thus acting almost impulsively.

Details

show
hide
Language(s): eng - English
 Dates: 2023-09-04
 Publication Status: Issued
 Pages: 1
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Degree: -

Event

show
hide
Title: 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference (CLEO/Europe-EQEC 2023)
Place of Event: Munich, Germany
Start-/End Date: 2023-06-26 - 2023-06-30

Legal Case

show

Project information

show

Source 1

show
hide
Title: 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC 2023)
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: IEEE
Pages: - Volume / Issue: - Sequence Number: 10231494 Start / End Page: - Identifier: ISBN: 979-835034599-5