Atom probe tomography for nanoscale characterization of functional materials

Jung, Chanwon

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Atom probe tomography for nanoscale characterization of functional materials

Jung, C. (2023). Atom probe tomography for nanoscale characterization of functional materials. Talk presented at Global Photovoltaic Conference 2023, Session: CiS. II-VI & Chalcogenide compound-based cells and materials, Satellite-CiS-2. Gwangju, Repuplic of Korea. 2023-09-06 - 2023-09-08.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-4341-D Version Permalink: https://hdl.handle.net/21.11116/0000-000E-4342-C

Genre: Talk

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Creators:
Jung, Chanwon¹, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294

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Language(s): eng - English

Dates: Created: 2023-09-08

Publication Status: Not specified

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Title: Global Photovoltaic Conference 2023, Session: CiS. II-VI & Chalcogenide compound-based cells and materials, Satellite-CiS-2

Place of Event: Gwangju, Repuplic of Korea

Start-/End Date: 2023-09-06 - 2023-09-08

Invited: Yes

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