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キーワード:
Atomic force microscopy, Bax, Piercing force, Pore-forming protein, Supported lipid bilayer
要旨:
Atomic force microscopy (AFM) is a form of contact microscopy that uses a very sharp tip to scan the surfaceSurface of a sample. It provides a 3D image of the surface structure and in the force mode it can also be used to test the mechanical properties of the sample. AFM has been successfully applied to study the molecular mechanism of pore-forming proteins on model membranes. It gives information about both the structural reorganization of the membrane surface and the changes in the force required for membrane piercing upon incubation with this special type of proteins. Here we describe robust protocols to investigate the effect of pore-forming proteins in supported lipid bilayersSupported lipid bilayers (SLBs).
