Modulated illumination microscopy: Application perspectives in nuclear 
nanostructure analysis

Cremer, Christoph; Schock, Florian; Failla, Antonio Virgilio; Birk, Udo

doi:10.1111/jmi.13297

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Modulated illumination microscopy: Application perspectives in nuclear nanostructure analysis

Cremer, C., Schock, F., Failla, A. V., & Birk, U. (2024). Modulated illumination microscopy: Application perspectives in nuclear nanostructure analysis. Journal of Microscopy. doi:10.1111/jmi.13297.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000F-395B-C Version Permalink: https://hdl.handle.net/21.11116/0000-000F-395C-B

Genre: Journal Article

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Creators:
Cremer, Christoph^{1, 2, 3}, Author
Schock, Florian, Author
Failla, Antonio Virgilio, Author
Birk, Udo, Author

Affiliations:
1Kirchhoff Institute for Physics (KIP), Heidelberg, Germany, ou_persistent22
2Interdisciplinary Centre for Scientific Computing (IWR), University of Heidelberg, Heidelberg, Germany, ou_persistent22
3Dept. Bonn: Molecular Spectroscopy, MPI for Polymer Research, Max Planck Society, ou_1800285

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Language(s): eng - English

Dates: Published Online: 2024-04-15

Publication Status: Published online

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Identifiers: DOI: 10.1111/jmi.13297

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Title: Journal of Microscopy

Source Genre: Journal

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Publ. Info: Hoboken, New Jersey, USA : Wiley-Blackwell

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: ISSN: 0022-2720
CoNE: https://pure.mpg.de/cone/journals/resource/954927663105_2