Comparison of Model Order Reduction Methods for a Linear Finite Element Model 
of an Electrically Stimulated Neuron

Fitzer, Ulrike; Goyal, Pawan Kumar; Schuetz, Arwed; Zawra, Ibrahim; Hohlfeld, Dennis; Bechtold, Tamara

doi:10.1109/EuroSimE60745.2024.10491473

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Comparison of Model Order Reduction Methods for a Linear Finite Element Model of an Electrically Stimulated Neuron

Fitzer, U., Goyal, P. K., Schuetz, A., Zawra, I., Hohlfeld, D., & Bechtold, T. (2024). Comparison of Model Order Reduction Methods for a Linear Finite Element Model of an Electrically Stimulated Neuron. In 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2024. Institute of Electrical and Electronics Engineers Inc. doi:10.1109/EuroSimE60745.2024.10491473.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000F-3E4F-5 Version Permalink: https://hdl.handle.net/21.11116/0000-000F-3E50-2

Genre: Conference Paper

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Creators:
Fitzer, Ulrike^{1, 2}, Author
Goyal, Pawan Kumar³, Author
Schuetz, Arwed^{1, 2}, Author
Zawra, Ibrahim^{1, 2}, Author
Hohlfeld, Dennis², Author
Bechtold, Tamara^{1, 2}, Author

Affiliations:
1Jade University of Applied Sciences, Department of Engineering, Wilhelmshaven, ou_persistent22
2University of Rostock, ou_persistent22
3Computational Methods in Systems and Control Theory, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society, ou_1738141

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Dates: Published Online: 2024

Publication Status: Published online

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Identifiers: DOI: 10.1109/EuroSimE60745.2024.10491473

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Title: 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2024)

Place of Event: Catania, Italy

Start-/End Date: 2024-04-07 - 2024-04-10

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Title: 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2024

Source Genre: Proceedings

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Publ. Info: Institute of Electrical and Electronics Engineers Inc.

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: ISBN: 979-835039363-7