An Analysis of Ternary Simulation as a Tool for Race Detection in Digital MOS 
Circuits

Lengauer, Thomas; Näher, Stefan

doi:10.1016/0167-9260(86)90012-X

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An Analysis of Ternary Simulation as a Tool for Race Detection in Digital MOS Circuits

Lengauer, T., & Näher, S. (1986). An Analysis of Ternary Simulation as a Tool for Race Detection in Digital MOS Circuits. Integration, 4(4), 309-330. doi:10.1016/0167-9260(86)90012-X.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000F-8F48-0 Version Permalink: https://hdl.handle.net/21.11116/0000-000F-8F49-F

Genre: Journal Article

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Creators:
Lengauer, Thomas¹, Author
Näher, Stefan¹, Author

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1External Organizations, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 1986

Publication Status: Issued

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Identifiers: DOI: 10.1016/0167-9260(86)90012-X
BibTex Citekey: DBLP:journals/integration/LengauerN86

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Title: Integration

Source Genre: Journal

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Publ. Info: Amsterdam : Elsevier

Pages: - Volume / Issue: 4 (4) Sequence Number: - Start / End Page: 309 - 330 Identifier: -