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  Combining PIXE and EBS for the analysis of paint layers: Experiment and simulation highlight the influence of the pigment grain size

Beck, L., Mayer, M., Silva, T. F., Berthier, C., & Pichon, L. (2024). Combining PIXE and EBS for the analysis of paint layers: Experiment and simulation highlight the influence of the pigment grain size. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 555: 165468. doi:10.1016/j.nimb.2024.165468.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000F-9AD7-1 Version Permalink: https://hdl.handle.net/21.11116/0000-000F-A8AA-4
Genre: Journal Article

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 Creators:
Beck, L.1, Author
Mayer, M.2, Author                 
Silva, T. F.1, Author
Berthier, C.1, Author
Pichon, L.1, Author
Affiliations:
1External Organizations, ou_persistent22              
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              

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Free keywords: Konferenzbeitrag
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Language(s): eng - English
 Dates: 20242024
 Publication Status: Issued
 Pages: 7 p.
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 Rev. Type: Peer
 Identifiers: DOI: 10.1016/j.nimb.2024.165468
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Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  Abbreviation : NIM B
  Subtitle : 26th International Conference on Ion Beam Analysis (IBA 2023) & 18th International Conference on Particle Induce X-ray Emission (PIXE)
Source Genre: Journal
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Publ. Info: Amsterdam : Elsevier B.V.
Pages: - Volume / Issue: 555 Sequence Number: 165468 Start / End Page: - Identifier: ISSN: 0168-583X
CoNE: https://pure.mpg.de/cone/journals/resource/954925484704