Characterization of the 166-Pixel Monolithic SDD TRISTAN Detector with Photons 
and Electrons in the KATRIN Monitor Spectrometer

Carminati, M.; Siegmann, D.; Urban, K.; Edzards, F.; Lechner, P.; Fiorini, C. E.; Steidl, M.; Mertens, S.

doi:10.1109/NSSMICRTSD49126.2023.10338199

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Characterization of the 166-Pixel Monolithic SDD TRISTAN Detector with Photons and Electrons in the KATRIN Monitor Spectrometer

Carminati, M., Siegmann, D., Urban, K., Edzards, F., Lechner, P., Fiorini, C. E., et al. (2023). Characterization of the 166-Pixel Monolithic SDD TRISTAN Detector with Photons and Electrons in the KATRIN Monitor Spectrometer. In 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (pp. 1-1). doi:10.1109/NSSMICRTSD49126.2023.10338199.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000F-AFDD-4 Version Permalink: https://hdl.handle.net/21.11116/0000-000F-AFDE-3

Genre: Conference Paper

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Creators:
Carminati, M.¹, Author
Siegmann, D.¹, Author
Urban, K.¹, Author
Edzards, F.¹, Author
Lechner, P.², Author
Fiorini, C. E.¹, Author
Steidl, M.¹, Author
Mertens, S.¹, Author

Affiliations:
1External Organizations, ou_persistent22
2Max Planck Semiconductor Laboratory, Max Planck Society, Isarauenweg 1, 85748 Garching bei München, DE, ou_3587780

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Free keywords: Spectroscopy;Microwave integrated circuits;Neutrino sources;Semiconductor detectors;Energy resolution;Silicon;JFETs

Abstract: We report on the characterization of a monolithic array of 166 Silicon Drift Detectors (SDD) with integrated JFET. This high-density detection module (4 cm by 4 cm) was designed and assembled within the TRISTAN development of the KATRIN experiment for search of sterile neutrinos in the keV mass range by means of beta spectroscopy. The detector was commissioned in the KATRIN monitor spectrometer and was exposed both to X-ray photons (at 5.9 keV of Fe55) and electrons (at 32.2 keV energy of Kr83m) reaching state-of-the-art homogeneity and energy resolution: 157 eV and 352.8 eV FWHM respectively (with 2 us shaping time and -33°C cooling).

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Dates: Published Online: 2023-12-13Date issued: 2023

Publication Status: Issued

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Identifiers: DOI: 10.1109/NSSMICRTSD49126.2023.10338199
BibTex Citekey: 10338199

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Title: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)

Source Genre: Proceedings

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1 - 1 Identifier: -