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  Reliable substrate characterization in the broadband range of 220-1700 nm based on spectral photometric data

Amochkina, T., Matusevich, V., & Trubetskov, M. K. (2024). Reliable substrate characterization in the broadband range of 220-1700 nm based on spectral photometric data. In Advances in Optical Thin Films VIII. SPIE. doi:10.1117/12.3017217.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000F-DD14-2 Version Permalink: https://hdl.handle.net/21.11116/0000-000F-DD15-1
Genre: Conference Paper

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130200O.pdf (Publisher version), 500KB
 
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 Creators:
Amochkina, Tatiana1, Author
Matusevich, Vladislav1, Author
Trubetskov, Michael K.2, Author           
Affiliations:
1external, ou_persistent22              
2Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564              

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Language(s): eng - English
 Dates: 2024-06-24
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: 001281497200023
DOI: 10.1117/12.3017217
 Degree: -

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Title: Conference on Advances in Optical Thin Films VIII
Place of Event: Strasbourg, FRANCE
Start-/End Date: 2024-04-08 - 2024-04-11
Invited: Yes

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Title: Advances in Optical Thin Films VIII
Source Genre: Proceedings
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Publ. Info: SPIE
Pages: - Volume / Issue: - Sequence Number: 130200O Start / End Page: - Identifier: ISSN: 0277-786X
ISBN: 978-1-5106-7359-5; 978-1-5106-7358-8

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Title: Proceedings of SPIE
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Publ. Info: SPIE
Pages: - Volume / Issue: 13020 Sequence Number: 130200O Start / End Page: - Identifier: ISSN: 0277-786X