Scheu, C., Abdellaoui, L., Bueno Villoro, R., Cojocaru-Mirédin, O., Gault, B., Luo, T., et al. (2022). A scale bridging approach for analysis of extended defects in thermoelectric materials: From electron channeling contrast imaging, scanning transmission electron microscopy to atom probe tomography. Talk presented at ELMINA2022. Belgrade, Serbia. 2022-08-22 - 2022-08-26.