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  Beyond Atom Mapping in Atom Probe Tomography Using Field Evaporation Energy Loss Spectroscopy

Vurpillot, F., Rousseau, L., Hatzoglou, C., Normand, A., Gault, B., & Cerezo, A. (2023). Beyond Atom Mapping in Atom Probe Tomography Using Field Evaporation Energy Loss Spectroscopy. Microscopy and Microanalysis, 29(Supplement_1), 605-606. doi:10.1093/micmic/ozad067.293.

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10.1093_micmic_ozad067.293.pdf (Publisher version), 694KB
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 Creators:
Vurpillot, François1, Author           
Rousseau, Loïc2, 3, Author           
Hatzoglou, Constantinos4, Author           
Normand, Antoine2, Author           
Gault, Baptiste5, 6, Author           
Cerezo, Alfred7, Author
Affiliations:
1Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, 76000, Rouen, France, ou_persistent22              
2Groupe Physique des Matériaux, Université de Rouen, Saint Etienne du Rouvray, Normandie 76800, France, ou_persistent22              
3ESIGELEC, Avenue Galilée, Saint Etienne du Rouvray, Normandie 76800, France, ou_persistent22              
4Groupe Physique des Matériaux, Normandie, France, ou_persistent22              
5Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
6Department of Materials, Royal School of Mines, Imperial College, Prince Consort Road, London, SW7 2BP, United Kingdom, ou_persistent22              
7Materials Department, University of Oxford, United Kingdom, ou_persistent22              

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Language(s): eng - English
 Dates: 2023-07-22
 Publication Status: Issued
 Pages: -
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 Rev. Type: Peer
 Identifiers: DOI: 10.1093/micmic/ozad067.293
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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
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Publ. Info: New York, NY : Cambridge University Press
Pages: 2 Volume / Issue: 29 (Supplement_1) Sequence Number: - Start / End Page: 605 - 606 Identifier: CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414
ISSN: 1431-9276