Tungsten oxide thin films probed by depth-resolved positron annihilation 
spectroscopy

Burwitz, V. V.; Kärcher, A.; Mathes, L.; Book, A.; Paul, N.; Schwarz-Selinger, T.; Butterling, M.; Hirschmann, E.; Liedke, M. O.; Wagner, A.; Unsal, E.; Cuniberti, G.; Hugenschmidt, C.

doi:10.1103/PhysRevB.111.054114

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Tungsten oxide thin films probed by depth-resolved positron annihilation spectroscopy

Burwitz, V. V., Kärcher, A., Mathes, L., Book, A., Paul, N., Schwarz-Selinger, T., et al. (2025). Tungsten oxide thin films probed by depth-resolved positron annihilation spectroscopy. Physical Review E, 111: 054114. doi:10.1103/PhysRevB.111.054114.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0010-C7F0-E Version Permalink: https://hdl.handle.net/21.11116/0000-0010-CC89-E

Genre: Journal Article

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https://doi.org/10.1103/PhysRevB.111.054114 (Publisher version) Open Access Hybrid

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Creators:
Burwitz, V. V.¹, Author
Kärcher, A.¹, Author
Mathes, L.¹, Author
Book, A.¹, Author
Paul, N.¹, Author
Schwarz-Selinger, T.², Author
Butterling, M.¹, Author
Hirschmann, E.¹, Author
Liedke, M. O.¹, Author
Wagner, A.¹, Author
Unsal, E.¹, Author
Cuniberti, G.¹, Author
Hugenschmidt, C.¹, Author

Affiliations:
1External Organizations, ou_persistent22
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327

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Language(s): eng - English

Dates: Submitted: 2023Date issued: 2025

Publication Status: Issued

Pages: 13 p.

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Rev. Type: Peer

Identifiers: DOI: 10.1103/PhysRevB.111.054114

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Title: Physical Review E

Other : Phys. Rev. E

Source Genre: Journal

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Publ. Info: Melville, NY : American Physical Society

Pages: - Volume / Issue: 111 Sequence Number: 054114 Start / End Page: - Identifier: ISSN: 1539-3755
CoNE: https://pure.mpg.de/cone/journals/resource/954925225012