English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Saturated patterned excitation microscopy with two-dimensional excitation patterns

Heintzmann, R. (2003). Saturated patterned excitation microscopy with two-dimensional excitation patterns. Micron, 34, 283-291. Retrieved from http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6T9N-48XS043-1-30&_cdi=5119&_user=38661&_pii=S0968432803000532&_orig=search&_coverDate=10%2F31%2F2003&_sk=999659993&view=c&wchp=dGLzVlb-zSkzS&md5=75eb5c5b740a4336002576001c27d8a5&ie=/sdarticle.pdf.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0012-F1BF-3 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0027-E428-0
Genre: Journal Article

Files

show Files
hide Files
:
42766.pdf (Publisher version), 0B
 
File Permalink:
-
Name:
42766.pdf
Description:
-
Visibility:
Restricted (Max Planck Institute for Biophysical Chemistry (Karl Friedrich Bonhoeffer Institute), Göttingen; )
MIME-Type / Checksum:
application/pdf
Technical Metadata:
Copyright Date:
-
Copyright Info:
-
License:
-

Locators

show

Creators

show
hide
 Creators:
Heintzmann, R.1, Author              
Affiliations:
1Department of Molecular Biology, MPI for biophysical chemistry, Max Planck Society, ou_578628              

Content

show
hide
Free keywords: Structured Illumination, Non-linear Microscopy, Resolution Enhancement, Widefield, Virtual Microscopy
 Abstract: The techniques of patterned excitation microscopy (PEM, also referred to in the literature as structured illumination, harmonic excitation light microscopy, or laterally modulated excitation microscopy), has recently been extended to the non-linear regime, permitting a further increase in resolution breaking the Abbé diffraction limit (saturated PEM, SPEM). Fluorescence saturation was suggested as the non-linear effect employed to achieve this aim. Here a two-dimensional extension of the linear and the non-linear patterned excitation technique is introduced and simulations of the expected resolution improvement are presented. The simulations account for photon statistics, a sub-optimal degree of modulation and a high amount of background fluorescence in the sample. The resulting point-spread-functions achieve a full width at half maximum of 215 nm (widefield), 118 nm (linear PEM), and 57 nm (saturated PEM, 9 x 9 orders). For higher resolution, an increased number of detected photons and of raw data images are required. A potential method for substantially decreasing the required number of raw images in PEM and SPEM is discussed.

Details

show
hide
Language(s): eng - English
 Dates: 2003
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Micron
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 34 Sequence Number: - Start / End Page: 283 - 291 Identifier: -