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  Saturated patterned excitation microscopy - a concept for optical resolution improvement

Heintzmann, R., Jovin, T. M., & Cremer, C. (2002). Saturated patterned excitation microscopy - a concept for optical resolution improvement. Journal of the Optical Society of America A-Optics Image Science and Vision, 19(8), 1599-1609. Retrieved from http://www.opticsinfobase.org/viewmedia.cfm?uri=josaa-19-8-1599&seq=0.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0012-F34C-6 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-2C23-B
Genre: Journal Article

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599549.pdf (Publisher version), 662KB
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Heintzmann, R.1, Author              
Jovin, T. M.1, Author              
Cremer, C., Author
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1Department of Molecular Biology, MPI for biophysical chemistry, Max Planck Society, ou_578628              

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 Abstract: The resolution of optical microscopy is limited by the numerical aperture and the wavelength of light. Many strategies for improving resolution such as 4Pi and (IM)-M-5 have focused on an increase of the numerical aperture, Other approaches have based resolution improvement in fluorescence microscopy on the establishment of a nonlinear relationship between local excitation light intensity in the sample and in the emitted light. However, despite their innovative character, current techniques such as stimulated emission depletion (STED) and ground-state depletion (GSD) microscopy require complex optical configurations and instrumentation to narrow the point-spread function. We develop the theory of nonlinear patterned excitation microscopy for achieving a substantial improvement in resolution by deliberate saturation of the fluorophore excited state. The postacquisition manipulation of the acquired data is computationally more complex than in STED or GSD, but the experimental requirements are simple. Simulations comparing saturated patterned excitation microscopy with linear patterned excitation microscopy (also referred to in the literature as structured illumination or harmonic excitation light microscopy) and ordinary widefield microscopy are presented and discussed. The effects of photon noise are included in the simulations. (C) 2002 Optical Society of America.

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Language(s): eng - English
 Dates: 2002-08
 Publication Status: Published in print
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 Rev. Method: Peer
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Title: Journal of the Optical Society of America A-Optics Image Science and Vision
Source Genre: Journal
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Pages: - Volume / Issue: 19 (8) Sequence Number: - Start / End Page: 1599 - 1609 Identifier: -