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  Stimulated emission depletion microscopy with a single offset beam.

Klar, T. A., Dyba, M., & Hell, S. W. (2001). Stimulated emission depletion microscopy with a single offset beam. Applied Physics Letters, 78(4), 393-395. Retrieved from http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000078000004000393000001&idtype=cvips&doi=10.1063/1.1338491&prog=normal.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0012-F552-2 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0027-E35E-F
Genre: Journal Article

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 Creators:
Klar, T. A.1, Author              
Dyba, M.2, Author
Hell, S. W.1, Author              
Affiliations:
1Department of NanoBiophotonics, MPI for biophysical chemistry, Max Planck Society, ou_578627              
2Max Planck Society, ou_persistent13              

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Language(s): eng - English
 Dates: 2001-01-22
 Publication Status: Published in print
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Title: Applied Physics Letters
Source Genre: Journal
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Pages: - Volume / Issue: 78 (4) Sequence Number: - Start / End Page: 393 - 395 Identifier: -