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  Subresolution axial distance measurements in far-field fluorescence microscopy with precision of 1 nanometer.

Schmidt, M., Nagorni, M., & Hell, S. W. (2000). Subresolution axial distance measurements in far-field fluorescence microscopy with precision of 1 nanometer. Review of Scientific Instruments, 71, 2742-2745.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0012-F955-D Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-912B-C
Genre: Journal Article

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 Creators:
Schmidt, M.1, Author              
Nagorni, M.2, Author              
Hell, S. W.2, Author              
Affiliations:
1Department of NMR Based Structural Biology, MPI for biophysical chemistry, Max Planck Society, ou_578567              
2Department of NanoBiophotonics, MPI for biophysical chemistry, Max Planck Society, ou_578627              

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 Dates: 2000
 Publication Status: Published in print
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 Identifiers: eDoc: 233910
Other: 23260
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Title: Review of Scientific Instruments
Source Genre: Journal
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Pages: - Volume / Issue: 71 Sequence Number: - Start / End Page: 2742 - 2745 Identifier: -