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  Array detector for the atomic force microscope

Schaeffer, T. E., Richter, M., & Viani, M. (2000). Array detector for the atomic force microscope. Applied Physics Letters, 76, 3644-3646.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0012-F967-5 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0027-E927-4
Genre: Journal Article

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 Creators:
Schaeffer, T. E.1, Author              
Richter, M., Author
Viani, M., Author
Affiliations:
1Department of Molecular Biology, MPI for biophysical chemistry, Max Planck Society, ou_578628              

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Free keywords: Optical-beam deflection. Small cantilevers. Applied Physics/Condensed Matter/Materials Science in Current Contents(R)/Physical, Chemical & Earth Sciences. 2-Aminopurine/*analysis/chemistry
 Abstract: We present a method for measuring the deflection of the optical beam in an atomic force microscope (AFM) that yields an increased signal-to-noise ratio, compared to the conventional two-segment detection. This increase is achieved by distributing the optical power from the beam across an array of photodetector segments and splitting it into multiple channels. Each channel has an adjustable gain factor that is set dynamically to weigh the contribution from each channel. We find a mathematical condition for the gain factors that allows detection of cantilever deflections with maximum signal-to-noise ratio and demonstrate this for the case of a 12-mu m-long cantilever in an AFM for small cantilevers.

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Language(s): eng - English
 Dates: 2005-08-052000
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 236825
Other: 23128
 Degree: -

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Title: Applied Physics Letters
  Alternative Title : Appl. Phys. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 76 Sequence Number: - Start / End Page: 3644 - 3646 Identifier: -