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Schlagwörter:
Force; Light; Reflection; Apertures; Spectroscopy/instrumentation/analytical sciences; Multidisciplinary
Zusammenfassung:
A new technique for producing polymeric cantilevers with integrated tips for combined scanning-force microscopy/scanning near-field optical microscopy is described in this paper. By integration reactive ion of etched polymeric and fluorescent tips to polymer-based cantilevers, it will become possible to produce apertureless sensors for a scanning near-field optical microscope with the well-known atomic-force distance control.
