Structural investigation of dipping lines in Langmuir-Blodgett films by 
scanning force microscopy

Wolthaus, L.; Schaper, A.; Moebius, D.; Jovin, T. M.

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Structural investigation of dipping lines in Langmuir-Blodgett films by scanning force microscopy

Wolthaus, L., Schaper, A., Moebius, D., & Jovin, T. M. (1994). Structural investigation of dipping lines in Langmuir-Blodgett films by scanning force microscopy. Thin Solid Films, 242(1-2), 170-173.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0013-0556-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-EC3B-2

Genre: Journal Article

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Creators:
Wolthaus, L.¹, Author
Schaper, A.², Author
Moebius, D.¹, Author
Jovin, T. M.², Author

Affiliations:
1Research Group of Molecular Organized Systems, MPI for biophysical chemistry, Max Planck Society, ou_578548
2Department of Molecular Biology, MPI for biophysical chemistry, Max Planck Society, ou_578628

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Language(s): eng - English

Dates: Date issued: 1994-04-15

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 276132
ISI: A1994NJ66800034

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Title: Thin Solid Films

Alternative Title : Thin Solid Films

Source Genre: Journal

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Pages: - Volume / Issue: 242 (1-2) Sequence Number: - Start / End Page: 170 - 173 Identifier: ISSN: 0040-6090