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  Double aberration correction in a low-energy electron microscope

Schmidt, T., Marchetto, H., Lévesque, P. L., Groh, U., Maier, F., Preikszas, D., et al. (2010). Double aberration correction in a low-energy electron microscope. Ultramicroscopy, 110(11), 1358-1361. doi:10.1016/j.ultramic.2010.07.007.

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 Creators:
Schmidt, Thomas1, Author           
Marchetto, Helder1, Author           
Lévesque, Pierre L.1, Author           
Groh, Ulli, Author
Maier, Florian, Author
Preikszas, Dirk, Author
Hartel, Peter, Author
Spehr, Rainer, Author
Lilienkamp, Gerhard, Author
Engel, Wilfried2, Author           
Fink, Rainer, Author
Bauer, Ernst, Author
Rose, Harald, Author
Umbach, Eberhard, Author
Freund, Hans-Joachim1, Author           
Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Language(s): eng - English
 Dates: 2010
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 442817
DOI: 10.1016/j.ultramic.2010.07.007
 Degree: -

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Title: Ultramicroscopy
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 110 (11) Sequence Number: - Start / End Page: 1358 - 1361 Identifier: -