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  A time-of-flight spectrometer for angle-resolved detection of low energy electrons in two dimensions

Kirchmann, P. S., Rettig, L., Nandi, D., Lipowski, U., Wolf, M., & Bovensiepen, U. (2008). A time-of-flight spectrometer for angle-resolved detection of low energy electrons in two dimensions. Applied Physics A, 91(2), 211-217. doi:10.1007/s00339-008-4422-5.

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 Creators:
Kirchmann, Patrick S.1, Author           
Rettig, Laurenz1, Author           
Nandi, Dhananjay, Author
Lipowski, Uwe, Author
Wolf, Martin1, Author           
Bovensiepen, Uwe, Author
Affiliations:
1Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              

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 Abstract: We developed a time-of-fight photoelectron spectrometer that simultaneously analyzes low energy electrons photoemitted from solid surfaces in an energy- and angle-resolved manner. To achieve this, a field free drift tube with an acceptance angle of 22° is combined with two-dimensional position-sensitive detection of photoelectrons, which is realized by a microchannel plate stack and a delay-line anode for position encoding. Here, we present the design considerations and principles of operation including analysis of multiple events per light pulse. The performance of the spectrometer is demonstrated by photoemission from a Cu(111) single crystalline surface by UV femtosecond laser pulses at 6.2 eV photon energy.

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Language(s): eng - English
 Dates: 2008-02-02
 Publication Status: Issued
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 Table of Contents: -
 Rev. Type: Peer
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Title: Applied Physics A
  Alternative Title : Appl. Phys. A
Source Genre: Journal
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Pages: - Volume / Issue: 91 (2) Sequence Number: - Start / End Page: 211 - 217 Identifier: -