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  Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties

Gajović, A., Gracin, D., Djerdj, I., Tomašić, N., Juraić, K., & Su, D. S. (2008). Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties. Applied Surface Science, 254(9), 2748-2754. doi:10.1016/j.apsusc.2007.10.014.

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Gajović, Andreja, Autor
Gracin, Davor, Autor
Djerdj, Igor, Autor
Tomašić, Nenad, Autor
Juraić, Krunoslav, Autor
Su, Dang Sheng1, Autor           
Affiliations:
1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Schlagwörter: Silicon; Solar cells; Nanostructures; Optical properties Electron microscopic investigations on thin films
 Zusammenfassung: A series of thin silicon films with different degrees of crystallinity were prepared by decomposition of silane gas highly diluted with hydrogen, in radiofrequency glow discharge. The crystallite size, shape, and the portion of crystalline phase were investigated by high-resolution transmission electron microscopy (HRTEM), selected area electron diffraction (SAED), Raman spectroscopy (RS), and X-ray powder diffraction (XRD). The absorption coefficient (a) was calculated from the measurement of UV–vis-transmittance. By using RS, the volume fractions of the crystalline phase were estimated from the ratio of the integrated intensities of transversal optical (TO)-related crystalline and amorphous bands. These results were in excellent agreement with the mean crystallite sizes measured in HRTEM images and crystallite sizes refined from XRD measurements. The red shift of absorption, appearing as a result of the increase of the crystal fraction, depends on the size and distribution of nanocrystals.

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Sprache(n): eng - English
 Datum: 2008
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: eDoc: 318914
DOI: 10.1016/j.apsusc.2007.10.014
 Art des Abschluß: -

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Titel: Applied Surface Science
Genre der Quelle: Zeitschrift
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: -
Seiten: - Band / Heft: 254 (9) Artikelnummer: - Start- / Endseite: 2748 - 2754 Identifikator: -