Kinoshita, K., Simon, G. H., König, T., Heyde, M., Freund, H.-J., Nakagawa, Y., Suzuki, S., Chun, W.-J., Oyama, S. T., Otani, S., & Asakura, K. (2008). A scanning tunneling microscopy observation of (√3x√3)R30° reconstructed Ni2P(0001). Japanese Journal of Applied Physics, 47(7), 6088-6091. doi:10.1143/JJAP.47.6088.