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  Electron paramagnetic resonance and scanning tunneling microscopy investigations on the formation of F+ and F0 color centers on the surface of thin MgO(001) films

Sterrer, M., Fischbach, E., Heyde, M., Nilius, N., Rust, H.-P., Risse, T., et al. (2006). Electron paramagnetic resonance and scanning tunneling microscopy investigations on the formation of F+ and F0 color centers on the surface of thin MgO(001) films. Journal of Physical Chemistry B, 110(17), 8665-8669. doi:10.1021/jp060546t.

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Sterrer, Martin1, Autor           
Fischbach, Esther1, Autor           
Heyde, Markus1, Autor           
Nilius, Niklas1, Autor           
Rust, Hans-Peter1, Autor           
Risse, Thomas1, Autor           
Freund, Hans-Joachim1, Autor           
Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022              

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 Zusammenfassung: The formation of surface color centers (FS centers) by electron bombardment of thin MgO(001) films is investigated using electron paramagnetic resonance and low-temperature scanning tunneling microscopy. At low electron doses both techniques indicate the formation of singly occupied color centers (FS+), whereas at high electron doses the doubly occupied type (FS0) is dominant. It is suggested that with increasing electron dose FS+ centers are transformed into FS0. Tunneling spectra of individual FS0 centers reveal a large distribution of energetic positions of occupied and unoccupied states, which is caused by local variations of the coordination number of the defects and explains the broad signals usually detected with integrating spectroscopic techniques.

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Sprache(n): eng - English
 Datum: 2006-05-04
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Art des Abschluß: -

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Titel: Journal of Physical Chemistry B
  Alternativer Titel : J. Phys. Chem. B
Genre der Quelle: Zeitschrift
 Urheber:
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Ort, Verlag, Ausgabe: -
Seiten: - Band / Heft: 110 (17) Artikelnummer: - Start- / Endseite: 8665 - 8669 Identifikator: -