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  Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum

Heyde, M., Sterrer, M., Rust, H.-P., & Freund, H.-J. (2005). Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum. Applied Physics Letters, 87(08), 083104–1-083104–3. doi:10.1063/1.2012523.

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 Creators:
Heyde, Markus1, Author           
Sterrer, Martin1, Author           
Rust, Hans-Peter1, Author           
Freund, Hans-Joachim1, Author           
Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022              

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Free keywords: magnesium compounds; atomic force microscopy; vibrations; force sensors
 Abstract: Atomic resolution with a double quartz tuning fork sensor for low-temperature ultrahigh vacuum atomic force and scanning tunneling microscopy is presented. The new features of the force sensor assembly are discussed. Atomically resolved images of MgO on Ag(001) have been obtained. Images acquired in the attractive and the repulsive regimes controlled to a constant frequency shift are shown, revealing contrast changes.

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Language(s): eng - English
 Dates: 2005-08-22
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Degree: -

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Title: Applied Physics Letters
  Alternative Title : Appl. Phys. Lett.
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 87 (08) Sequence Number: - Start / End Page: 083104–1 - 083104–3 Identifier: -