非表示:
キーワード:
silicon compounds; scanning tunnelling microscopy; reflectivity; infrared spectra; X-ray photoelectron spectra; density functional theory; insulating thin films
要旨:
The structure of a thin single crystalline SiO2 film grown on Mo(112) has been studied by scanning tunneling microscopy, infrared reflection absorption spectroscopy, and x-ray photoelectron spectroscopy. In excellent agreement with the experimental results, density functional theory calculations show that the film consists of a two-dimensional network of corner sharing [SiO4] tetrahedra, with one oxygen of each tetrahedron binding to the protruding Mo atoms of the Mo(112) surface.
