English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
 Local TagsRelease HistoryDetailsSummary
  Ab initio study of transition-metal silicide films on Si(001)

Wu, H., Kratzer, P., & Scheffler, M. (2005). Ab initio study of transition-metal silicide films on Si(001). In J. Menendez, & C. Van de Walle (Eds.), Physics of Semiconductors: 27th International Conference on the Physics of Semiconductors (pp. 311-312). USA: American Institute of Physics.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-0870-7 Version Permalink: https://hdl.handle.net/21.11116/0000-0006-39AA-B
Genre: Conference Paper

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Wu, Hua1, Author           
Kratzer, Peter1, Author           
Scheffler, Matthias1, Author           
Affiliations:
1Theory, Fritz Haber Institute, Max Planck Society, ou_634547              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2005-06
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 226307
DOI: 10.1063/1.1994113
 Degree: -

Event

show
hide
Title: 27th International Conference on the Physics of Semiconductors (ICPS-27)
Place of Event: Flagstaff, Arizona
Start-/End Date: 2004-07-26 - 2004-07-30

Legal Case

show

Project information

show

Source 1

show
hide
Title: Physics of Semiconductors: 27th International Conference on the Physics of Semiconductors
Source Genre: Proceedings
 Creator(s):
Menendez, J., Editor
Van de Walle, C.G., Editor
Affiliations:
-
Publ. Info: USA : American Institute of Physics
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 311 - 312 Identifier: -

Source 2

show
hide
Title: AIP Conference Proceedings
Source Genre: Series
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 772 Sequence Number: - Start / End Page: - Identifier: -