hide
Free keywords:
Silicon; Single crystal surface; Phenol adsorption; High resolution core-level photoemission; Synchrotron radiation photoelectron spectroscopy; Surface chemical reaction
Abstract:
The adsorption of a bi-functional organic molecule like phenol on Si(1 0 0)2 × 1 has been investigated by synchrotron radiation-induced photoemission in the valence band, Si 2p, C 1s and O 1s core-level regions. Experiments have been carried out as a function of phenol exposure at room temperature. Phenol adsorbs on Si(1 0 0)2 × 1 through a dissociative mechanism at room temperature, interacting with the surface by its alcoholic functionality. The line-shape analysis of Si 2p spectra indicates the formation of Si–O and Si–H bonds, as a consequence of the cleavage of the C₆H₅O–H bond and the binding of the fragments ( C₆H₅O– group and H atom) to the Si(1 0 0)2 × 1 surface dimers. The progressive quenching of the silicon surface dimer atoms and the corresponding intensity increase of the Si–O C₆H₅ and Si–H components have been observed as a function of phenol exposure. The presence of the phenoxide ( C₆H₅O–) group on the silicon surface has been evidenced also by the C 1s spectrum, consisting of two components in a 1:5 intensity ratio, energy splitted by 1.5 eV, which can be assigned to carbon atom linked to oxygen (C–O group) and carbon atoms of the aromatic ring, respectively.
