High Resolution EELS Using Monochromator and High Performance Spectrometer: 
Comparison of V2O5 ELNES with NEXAFS and Band Structure Calculations

Su, Dang Sheng; Zandbergen, Henny W.; Tiemeijer, Peter C.; Kothleitner, Gerald; Hävecker, Michael; Hébert, Cécile; Knop-Gericke, Axel; Freitag, Bert H.; Hofer, Ferdinand; Schlögl, Robert

doi:10.1016/S0968-4328(03)00033-7

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High Resolution EELS Using Monochromator and High Performance Spectrometer: Comparison of V₂O₅ ELNES with NEXAFS and Band Structure Calculations

Su, D. S., Zandbergen, H. W., Tiemeijer, P. C., Kothleitner, G., Hävecker, M., Hébert, C., et al. (2003). High Resolution EELS Using Monochromator and High Performance Spectrometer: Comparison of V₂O₅ ELNES with NEXAFS and Band Structure Calculations. Micron, 34(3-5), 235-238. doi:10.1016/S0968-4328(03)00033-7.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-0F8D-6 Version Permalink: https://hdl.handle.net/21.11116/0000-0006-89B1-7

Genre: Journal Article

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Su, Dang Sheng¹, Author
Zandbergen, Henny W., Author
Tiemeijer, Peter C., Author
Kothleitner, Gerald, Author
Hävecker, Michael¹, Author
Hébert, Cécile, Author
Knop-Gericke, Axel¹, Author
Freitag, Bert H., Author
Hofer, Ferdinand, Author
Schlögl, Robert¹, Author

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1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023

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Free keywords: Project 35: Electron microscopic investigations on V-oxides

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Language(s): eng - English

Dates: Date issued: 2003-07-20

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 1966
DOI: 10.1016/S0968-4328(03)00033-7

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Title: Micron

Source Genre: Journal

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Pages: - Volume / Issue: 34 (3-5) Sequence Number: - Start / End Page: 235 - 238 Identifier: -