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  Comparison of ELNES and NEXAFS of vanadium oxide V2O5 with different spectral resolution

Su, D. S., Hävecker, M., Knop-Gericke, A., Mayer, R. W., Hébert, C., & Schlögl, R. (2002). Comparison of ELNES and NEXAFS of vanadium oxide V2O5 with different spectral resolution. Talk presented at Microscopy & Microanalysis 2002. Quebec, Canada. 2002-08-04 - 2002-08-08.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-1421-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-1422-9
Genre: Talk

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 Creators:
Su, Dang Sheng1, Author           
Hävecker, Michael1, Author           
Knop-Gericke, Axel1, Author           
Mayer, Ralf W.1, Author           
Hébert, Cécile1, Author           
Schlögl, Robert1, Author           
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1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Free keywords: Scientific Project 35: Electron microscopic investigations on V-oxides
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Language(s): eng - English
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 Identifiers: eDoc: 1822
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Title: Microscopy & Microanalysis 2002
Place of Event: Quebec, Canada
Start-/End Date: 2002-08-04 - 2002-08-08

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