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  In situ UV/Vis/near-IR diffuse reflection measurement of catalysts at temperatures up to 673 K

Thiede, M., & Melsheimer, J. (2002). In situ UV/Vis/near-IR diffuse reflection measurement of catalysts at temperatures up to 673 K. Review of Scientific Instruments, 73(2), 394-397. doi:10.1063/1.1430730.

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reflmeas8cd_fuer_pdf_mitzitat.pdf (Any fulltext), 349KB
 
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 Creators:
Thiede, Manfred1, Author           
Melsheimer, Jörg1, Author           
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1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Free keywords: Project 5, Acid-base & redox properties of heteropoly compounds
 Abstract: In-situ UV/VIS/near-IR diffuse reflectance spectroscopy can be carried out on catalysts with a suitable microreactor at temperatures up to 673 K. The experimental difficulties in the application of such a reactor at higher temperatures could be solved as follows:
Integrating sphere and reactor are connected by a ceramic part of high reflectivity and low thermal conductivity, i.e. the integrating sphere is enlarged. The signal/noise ratio increases by a factor of 2.
The standard IR-detector was replaced by a temperature-stabilized version. In addition watercooling jackets were mounted at the integrating sphere. The signal/noise ratio in the near-IR region was thus improved by a factor of 2-3 with a very good reproducibility of measurements.
To overcome an alteration of catalyst spectra by thermal radiation, a series of reference spectra of quartz powder (SiO2) were recorded at several temperatures. These spectra are used to correct the catalyst spectra by dividing catalyst and SiO2 spectra.

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Language(s): eng - English
 Dates: 2002
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 1443
DOI: 10.1063/1.1430730
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Title: Review of Scientific Instruments
Source Genre: Journal
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Pages: - Volume / Issue: 73 (2) Sequence Number: - Start / End Page: 394 - 397 Identifier: -