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  Chemical and electron beam reduction of vanadium oxides monitored by EELS and NEXAFS

Su, D. S., Hävecker, M., Willinger, M. G., & Schlögl, R. (2001). Chemical and electron beam reduction of vanadium oxides monitored by EELS and NEXAFS. Talk presented at Microscopy & Microanalysis 2001. Long Beach, Ca, USA. 2001-08-05 - 2001-08-09.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-17D2-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-7A3C-3
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 Creators:
Su, Dang Sheng1, Author           
Hävecker, Michael1, Author           
Willinger, Marc Georg1, Author           
Schlögl, Robert1, Author           
Affiliations:
1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Free keywords: Scientific Project 35: Electron microscopic investigations on V-oxides
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Language(s): eng - English
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 Identifiers: eDoc: 1660
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Title: Microscopy & Microanalysis 2001
Place of Event: Long Beach, Ca, USA
Start-/End Date: 2001-08-05 - 2001-08-09

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