ausblenden:
Schlagwörter:
Porous Si; "Sandwich" structure; MIM structure; Electroluminescence; Light emission
Zusammenfassung:
The spectra of light emission from a separate emission center in porous silicon contained in "sandwich" structures were measured under the passage of electrical current as a function of applied voltage. The light intensity increases quicker in the short-wave part of the spectrum than in the long-wave part on increasing the voltage. Such a feature of the spectrum change has been observed earlier for island metal films.