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  TEM and EELS characterisation of ZrO2 thin films obtained by self-assembled monolayer-mediated deposition

Roddatis, V. V., Su, D. S., Beckmann, E., Jentoft, F. C., Fischer, A., Kröhnert, J., et al. (2000). TEM and EELS characterisation of ZrO2 thin films obtained by self-assembled monolayer-mediated deposition. Poster presented at Autumn School on Materials Science and Electron Microscopy 2000, Berlin, Germany.

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 Creators:
Roddatis, Vladimir V.1, Author              
Su, Dang Sheng1, Author              
Beckmann, Erich1, Author              
Jentoft, Friederike C.1, Author              
Fischer, Armin1, Author              
Kröhnert, Jutta1, Author              
Schlögl, Robert1, Author              
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1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Free keywords: Project 3: Zirconium oxide model systems
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Language(s): eng - English
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 Identifiers: eDoc: 1281
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Title: Autumn School on Materials Science and Electron Microscopy 2000
Place of Event: Berlin, Germany
Start-/End Date: 2000-10-10 - 2000-10-15

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