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  Structure of extended defects in epitaxial CuInS2/Si(111)

Hunger, R., Su, D. S., Krost, A., Ellmer, D., Lewerenz, H. J., & Scheer, R. (2000). Structure of extended defects in epitaxial CuInS2/Si(111). Thin Solid Films, 361-362, 437-442. doi:10.1016/S0040-6090(99)00812-3.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-1C2A-6 Version Permalink: https://hdl.handle.net/21.11116/0000-0005-E4D5-9
Genre: Journal Article

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 Creators:
Hunger, Ralf, Author
Su, Dang Sheng1, Author           
Krost, Alois, Author
Ellmer, Dieter, Author
Lewerenz, Hans J., Author
Scheer, Roland, Author
Affiliations:
1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Free keywords: Cooperation with Hahn-Meitner Institute
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Language(s): eng - English
 Dates: 2000-02-21
 Publication Status: Issued
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 1676
URI: http://dx.doi.org/10.1016/S0040-6090(99)00812-3
DOI: 10.1016/S0040-6090(99)00812-3
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Title: Thin Solid Films
  Abbreviation : Thin Solid Films
Source Genre: Journal
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Publ. Info: Lausanne, Switzerland, etc. : Elsevier
Pages: 6 Volume / Issue: 361-362 Sequence Number: - Start / End Page: 437 - 442 Identifier: ISSN: 0040-6090
CoNE: https://pure.mpg.de/cone/journals/resource/954925449792