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  Transmission electron microscopy study of CuIn3Se5

Tham, A. T., Su, D. S., Neumann, W., Schubert-Bischoff, P., Beilharz, C., & Benz, K. W. (2000). Transmission electron microscopy study of CuIn3Se5. Crystal Research and Technology, 35(6-7), 823-830. doi:10.1002/1521-4079(200007)35:6/7<823:AID-CRAT823>3.0.CO;2-R.

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 Creators:
Tham, Anh Tuan, Author
Su, Dang Sheng1, Author           
Neumann, Wolfgang, Author
Schubert-Bischoff, Peter, Author
Beilharz, C., Author
Benz, K. W., Author
Affiliations:
1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Free keywords: TEM; CuInSe
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Language(s): eng - English
 Dates: 1997-07-271998-04-012000-11
 Publication Status: Issued
 Pages: 8
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
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Title: Crystal Research and Technology
Source Genre: Journal
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Publ. Info: Berlin, Fed. Rep. of Germany : Wiley-VCH
Pages: 8 Volume / Issue: 35 (6-7) Sequence Number: - Start / End Page: 823 - 830 Identifier: ISSN: 0232-1300
CoNE: https://pure.mpg.de/cone/journals/resource/954928496432