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  Atomic force microscopy studies of oxide thin films on organic self-assembled monolayers

Niesen, T. P., De Guire, M. R., Bill, J., Aldinger, F., Rühle, M., Fischer, A., et al. (1999). Atomic force microscopy studies of oxide thin films on organic self-assembled monolayers. Journal of Materials Research, 14(6), 2464-2475. doi:10.1557/JMR.1999.0331.

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 Creators:
Niesen, Thomas P.1, Author
De Guire, Mark R., Author
Bill, Joachim1, Author
Aldinger, Fritz1, Author
Rühle, Manfred1, Author
Fischer, Armin2, Author              
Jentoft, Friederike C.2, Author              
Schlögl, Robert2, Author              
Affiliations:
1Max Planck Society, ou_persistent13              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Free keywords: Project 3: Silicon-supported thin films of sulfated zirconia
 Abstract: Oxidic zirconium films prepared by chemical deposition from aqueous medium on sulfonic acid terminated self-assembled monolayers attached to an oxidized silicon surface were investigated with scanning electron microscopy and atomic force microscopy. Bulk precipitate forms in the 4mM Zr(SO4)2*4H2O, 0.4N HCl deposition medium at 343 K after approximately 30 min. Precipitate particles (200 nm and larger) were found embedded into the oxidic zirconium film and adsorbed on top of the film; they could be washed off but patches of the film were removed. Working with unstable deposition solutions, in which homogeneous nucleation occurs, leads to preparation-inherent flaws in the film.

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Language(s): eng - English
 Dates: 1998-09-181999-02-101999-06
 Publication Status: Published in print
 Pages: 12
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 1250
DOI: 10.1557/JMR.1999.0331
 Degree: -

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Title: Journal of Materials Research
  Abbreviation : J. Mater. Res.
Source Genre: Journal
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Publ. Info: Pittsburgh, PA : Published for the Materials Research Society by the American Institute of Physics
Pages: 12 Volume / Issue: 14 (6) Sequence Number: - Start / End Page: 2464 - 2475 Identifier: ISSN: 0884-2914
CoNE: https://pure.mpg.de/cone/journals/resource/954925550339