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Schlagwörter:
Project 3: Silicon-supported thin films of sulfated zirconia
Zusammenfassung:
Oxidic zirconium films prepared by chemical deposition from aqueous medium on sulfonic acid terminated self-assembled monolayers attached to an oxidized silicon surface were investigated with scanning electron microscopy and atomic force microscopy. Bulk precipitate forms in the 4mM Zr(SO4)2*4H2O, 0.4N HCl deposition medium at 343 K after approximately 30 min. Precipitate particles (200 nm and larger) were found embedded into the oxidic zirconium film and adsorbed on top of the film; they could be washed off but patches of the film were removed. Working with unstable deposition solutions, in which homogeneous nucleation occurs, leads to preparation-inherent flaws in the film.
