Microscopic Properties of Thin Films: Learning About Point Defects

Ourmazd, A.; Scheffler, Matthias; Heinemann, Martina; Rouviere, J.-L.

doi:10.1557/S0883769400046923

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Microscopic Properties of Thin Films: Learning About Point Defects

Ourmazd, A., Scheffler, M., Heinemann, M., & Rouviere, J.-L. (1992). Microscopic Properties of Thin Films: Learning About Point Defects. MRS Bulletin, 17, 24-31. doi:10.1557/S0883769400046923.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-2207-9 Version Permalink: https://hdl.handle.net/21.11116/0000-0008-F8F3-E

Genre: Journal Article

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Creators:
Ourmazd, A.¹, Author
Scheffler, Matthias², Author
Heinemann, Martina², Author
Rouviere, J.-L., Author

Affiliations:
1Max Planck Society, ou_persistent13
2Theory, Fritz Haber Institute, Max Planck Society, ou_634547

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Language(s): eng - English

Dates: Date issued: 1992-12

Publication Status: Issued

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Rev. Type: Peer

Identifiers: DOI: 10.1557/S0883769400046923

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Title: MRS Bulletin

Source Genre: Journal

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Pages: - Volume / Issue: 17 Sequence Number: - Start / End Page: 24 - 31 Identifier: -