Total-energy calculation for isolated oxygen impurities in silicon

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Total-energy calculation for isolated oxygen impurities in silicon

Weinert, C. M., Beeler, F., & Scheffler, M. (1988). Total-energy calculation for isolated oxygen impurities in silicon. J. Phys. C, 21, 841-846.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-2335-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-2336-2

Genre: Journal Article

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Creators:
Weinert, C. M.¹, Author
Beeler, F., Author
Scheffler, M.², Author

Affiliations:
1Max Planck Society, ou_persistent13
2Theory, Fritz Haber Institute, Max Planck Society, ou_634547

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Dates: Date issued: 1988

Publication Status: Issued

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Rev. Type: -

Identifiers: eDoc: 2902

Degree: -

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Title: J. Phys. C

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 21 Sequence Number: - Start / End Page: 841 - 846 Identifier: -