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  Chalcogen and vacancy pairs in silicon: Electronic structure and stabilities

Weinert, C. M., & Scheffler, M. (1986). Chalcogen and vacancy pairs in silicon: Electronic structure and stabilities. In H. von Bardeleben (Ed.), Defects in Semiconductors (pp. 25-30). Switzerland: Trans Tech Publications Ltd.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-2349-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-2349-7
Genre: Book Chapter

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Mat-Sci-Forum-10to12-25-1986.pdf (Any fulltext), 960KB
 
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 Creators:
Weinert, C. M., Author
Scheffler, Matthias1, Author           
Affiliations:
1Theory, Fritz Haber Institute, Max Planck Society, ou_634547              

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Language(s): eng - English
 Dates: 1986
 Publication Status: Issued
 Pages: -
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 Rev. Type: -
 Identifiers: eDoc: 2869
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Title: Defects in Semiconductors
Source Genre: Book
 Creator(s):
von Bardeleben, H.J., Editor
Affiliations:
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Publ. Info: Switzerland : Trans Tech Publications Ltd.
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 25 - 30 Identifier: -

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Title: Materials Science Forum
Source Genre: Series
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Pages: - Volume / Issue: 10-12 Sequence Number: - Start / End Page: - Identifier: -