Identifiaction of chalcogen defects in silicon

Beeler, Franz; Scheffler, Matthias; Jepsen, Ove; Gunnarsson, Olle

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Identifiaction of chalcogen defects in silicon

Beeler, F., Scheffler, M., Jepsen, O., & Gunnarsson, O. (1985). Identifiaction of chalcogen defects in silicon. Microscopic Identification of Electronic Defects in Semiconductors, 46, 117.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-2352-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-2354-D

Genre: Journal Article

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Creators:
Beeler, Franz¹, Author
Scheffler, Matthias², Author
Jepsen, Ove, Author
Gunnarsson, Olle, Author

Affiliations:
1Max Planck Society, ou_persistent13
2Theory, Fritz Haber Institute, Max Planck Society, ou_634547

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Language(s): eng - English

Dates: Date issued: 1985

Publication Status: Issued

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Table of Contents: -

Rev. Type: Peer

Identifiers: eDoc: 2880

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Title: Microscopic Identification of Electronic Defects in Semiconductors

Source Genre: Book

Creator(s):
Johnson, N. M., Editor
Bishop, S. G., Author
Watkins, G. D., Author

Affiliations:
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Publ. Info: Materials Reserach Society

Pages: - Volume / Issue: 46 Sequence Number: - Start / End Page: 117 Identifier: -

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Title: MRS Proceedings

Source Genre: Journal

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: -