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  Bulk and Surface Structure and High-Temperature Thermoelectric Properties of Inverse Clathrate-III in the Si-P-Te System

Zaikina, J. V., Takao, M., Kovnir, K., Teschner, D., Senyshyn, A., Schwarz, U., et al. (2010). Bulk and Surface Structure and High-Temperature Thermoelectric Properties of Inverse Clathrate-III in the Si-P-Te System. Chemistry-a European Journal, 16(42), 12582-12589. doi:10.1002/chem.201001990.

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 Creators:
Zaikina, Julia V.1, 2, 3, Author
Takao, Mori4, Author
Kovnir, Kirill2, 3, Author
Teschner, Detre5, Author           
Senyshyn, Anatoliy6, Author
Schwarz, Ulrich2, Author
Grin, Yuri2, Author
Shevelkov, Andrei V.1, Author
Affiliations:
1Chemistry Department, Lomonosov Moscow State University, Leniskie Gory, 1-3, Moscow 119991 (Russia), ou_persistent22              
2Max-Planck-Institut für Chemische Physik fester Stoffe Nöthnitzer Str. 40, Dresden 01187 (Germany, ou_persistent22              
3Department of Chemistry and Biochemistry Florida State University, Chieftan Way 95 Tallahassee, FL, 32306 (USA), ou_persistent22              
4MANA, National Institute for Materials Science, Namiki 1-1, Tsukuba 305-0044 (Japan), ou_persistent22              
5Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
6Forschungsneutronenquelle Heinz Maier-Leibnitz (FRM II) Technische Universität München, Lichtenbergstrasse 1, D-85747 Garching bei München (Germany), ou_persistent22              

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Free keywords: clathrates; neutron diffraction; thermal stability; thermoelectric materials; Zintl phases
 Abstract: The creation of thermoelectric materials for waste heat recovery and direct solar energy conversion is a challenge that forces the development of compounds that combine appreciable thermoelectric figure-of-merit with high thermal and chemical stability. Here we propose a new candidate for high-temperature thermoelectric materials, the type-III Si172−xPxTey cationic clathrate, in which the framework is composed of partially ordered silicon and phosphorus atoms, whereas tellurium atoms occupy guest positions. We show that the utmost stability of this clathrate (up to 1500 K) in air is ensured by the formation of a nanosized layer of phosphorus-doped silica on the surface, which prevents further oxidation and degradation. As-cast (non-optimized) Si-P-Te clathrates display rather high values of the thermoelectric figure-of-merit (ZT=0.24–0.36) in the temperature range of 700–1100 K. These ZT values are comparable to the best values achieved for the properly doped transition-metal-oxide materials. The methods of the thermoelectric efficiency optimization are discussed.

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Language(s): eng - English
 Dates: 2010-10-132010-11-08
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1002/chem.201001990
 Degree: -

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Title: Chemistry-a European Journal
  Other : Chem.-Eur. J.
Source Genre: Journal
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Publ. Info: Weinheim, Germany : VCH Verlagsgesellschaft
Pages: - Volume / Issue: 16 (42) Sequence Number: - Start / End Page: 12582 - 12589 Identifier: ISSN: 0947-6539
CoNE: https://pure.mpg.de/cone/journals/resource/954926979058